HM8118 LCR数字电桥

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性能特点
l          HM8118 LCR数字电桥基本精度为0.05%
l          具有L、C、R、|Z|、X、|Y|、G、B、D、Q、Θ、Δ、M、N 十四种测量功能；
l          20Hz～200kHz 69个步进测试频率点,0.1～1.5Vrms测试电压；
l          每秒高达12次测量；
l          串联、并联操作；
l          可选的元件极值和限值元件分选功能；
l          内置可编程电压和电流偏置；
l         HM8118 LCR数字电桥可进行参数转换测量；
l          可搭配高达40V外部直流偏置电流源，内置0～5V和0～200mA直流偏流源；
l          标配开尔文电缆和四线SMD元件测试夹具（顶针式）
l          标配USB/RS232接口；可选IGPIB(IEEE-488)接口。

HM8118 LCR数字电桥 技术参数
所有数据是在23摄氏度下，30分钟热机
测试条件
Test signal voltage:
1Vrms
Open and short corrections performed 进行开路短路清零之后
Measurement time:
SLOW     慢速
显示
Measurement modes:
Auto, L+Q, L+R, C+D, C+R, R+Q, Z+θ, Y+θ,

R+X, G+B, N-θ, M
Equivalent circuits:
Auto, Series or Parallel
Parameters displayed:
Value, Deviation or % Deviation
Averaging:
2…99 measurements
准确度
Primary Parameter:
Basic accuracy (Test voltage: 1.0V,
measurement SLOW/MEDIUM, autoranging
mode, constant voltage OFF, bias off)
For FAST mode double the basic accuracy
values

Secondary Parameter:

Basic accuracy D, Q:
± 0.0001 @ f = 1 kHz
Phase angle:
± 0.005° @ f= 1 kHz
测试范围
|Z|, R, X: L:
0.01 mΩ…100 MΩ
|Y|, G, B:
10 nS…1000 S
C:
0.01 pF…100 mF
L:
10 nH…100 kH
D:
0.0001…9.9999
Q:
0,1…9999.9
θ:
-180°…+180°
Δ:
-999.99 %…999.99 %
M:
1 μH…100 H
N:
0.95…500
测试参数及功能
Test frequency:
20 Hz~200 kHz (69 个频率点)

20 Hz, 24 Hz, 25 Hz, 30 Hz, 36 Hz, 40 Hz, 45 Hz, 50 Hz,
60 Hz, 72 Hz, 75 Hz, 80 Hz, 90 Hz, 100 Hz, 120 Hz, 150 Hz,
180 Hz, 200 Hz, 240 Hz, 250 Hz, 300 Hz, 360 Hz, 400 Hz,
450 Hz, 500 Hz, 600 Hz, 720 Hz, 750 Hz, 800 Hz, 900 Hz,
1.0 kHz, 1.2 kHz, 1.5 kHz, 1.8 kHz, 2.0 kHz, 2.4 kHz, 2.5 kHz,
3.0 kHz, 3.6 kHz, 4.0 kHz, 4.5 kHz, 5.0 kHz, 6.0 kHz, 7.2 kHz,
7.5 kHz, 8.0 kHz, 9.0 kHz, 10 kHz, 12 kHz, 15 kHz, 18 kHz,
20 kHz, 24 kHz, 25 kHz, 30 kHz, 36 kHz, 40 kHz, 45 kHz,
50 kHz, 60 kHz, 72 kHz, 75 kHz, 80 kHz, 90 kHz, 100 kHz,
120 kHz, 150 kHz, 180 kHz, 200 kHz
Frequency accuracy:
±100 ppm
AC test signal level:
50 mVrms…1.5 Vrms
Resolution:
10 mVrms
Drive level accuracy:
± (5 % + 5 mV)
Internal Bias Voltage:
0…+5.00 Vdc内置偏流源电压
Resolution:
10 mV
External Bias Voltage:
0…+ 40 Vdc (fused 0.5 A)
Internal Bias Current:
0…+200 mA
Resolution:
1 mA
Ranging:
Auto and Hold
Trigger:
Continuous, manual or external via interface,
Binning Interface or Trigger Input
Trigger delay time:
0…999 ms in 1 ms steps
测试速度
FAST
70 ms
MEDIUM
125 ms
SLOW
0.7 s
其他功能参数
Test signal level monitor:
Voltage, current
Error Correction:
Open, Short, Load
Save / Recall:
9 instrument settings
Front-end Protection:
Vmax ‹ √2/C
@ Vmax ‹ 200 V, C in Farads (1 Joule of stored energy)
Low Potential and
Low Current Guarding:
Ground, Driven Guard or Auto (fused)
Constant Voltage Mode (25 Ω source)
Temperature effects:
R, L or C:
± 5ppm/°C
Interface:
USB/RS-232 (HO820), IEEE-488 (option)
Safety Class:
Safety Class I (EN61010-1)
Power supply:
110…230 V ± 10 %, 50/60 Hz, CAT II
Power consumption:
approx. 20 Watt
Operating temperature:
+5°C...+40°C
Storage temperature:
-20°C...+70°C
Rel. humidity:
5%...80% (non condensing)
(W x H x D):
285 x 75 x 365 mm
Weight:
approx. 4 kg

随机附件
Power cable（电源线）,
Operator’s Manual（使用手册）
HZ184 4 Terminal Kelvin Test Cable（HZ184四端开尔文测试电缆）
HZ188 4 Terminal SMD Component Test Fixture （HZ188 顶针式四线SMD测试夹具）

可选附件
HZ181 4 Terminal Test Fixture including Shorting Plate （4端测试盒含短路板）
HZ186 4 Terminal Transformer Test Cable
HO118 Binning Interface
HO880 IEEE-488 (GPIB) Interface (galvanically isolated) （GPIB接口板）

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本页面标题 HM8118 LCR数字电桥 HM8118 LCR数字电桥

测试条件
Test signal voltage:	1Vrms
Open and short corrections performed 进行开路短路清零之后
Measurement time:	SLOW 慢速
显示
Measurement modes:	Auto, L+Q, L+R, C+D, C+R, R+Q, Z+θ, Y+θ,
	R+X, G+B, N-θ, M
Equivalent circuits:	Auto, Series or Parallel
Parameters displayed:	Value, Deviation or % Deviation
Averaging:	2…99 measurements
准确度
Primary Parameter:	Basic accuracy (Test voltage: 1.0V, measurement SLOW/MEDIUM, autoranging mode, constant voltage OFF, bias off) For FAST mode double the basic accuracy values

Secondary Parameter:
Basic accuracy D, Q:	± 0.0001 @ f = 1 kHz
Phase angle:	± 0.005° @ f= 1 kHz
测试范围
\|Z\|, R, X: L:	0.01 mΩ…100 MΩ
\|Y\|, G, B:	10 nS…1000 S
C:	0.01 pF…100 mF
L:	10 nH…100 kH
D:	0.0001…9.9999
Q:	0,1…9999.9
θ:	-180°…+180°
Δ:	-999.99 %…999.99 %
M:	1 μH…100 H
N:	0.95…500
测试参数及功能
Test frequency:	20 Hz~200 kHz (69 个频率点)
	20 Hz, 24 Hz, 25 Hz, 30 Hz, 36 Hz, 40 Hz, 45 Hz, 50 Hz, 60 Hz, 72 Hz, 75 Hz, 80 Hz, 90 Hz, 100 Hz, 120 Hz, 150 Hz, 180 Hz, 200 Hz, 240 Hz, 250 Hz, 300 Hz, 360 Hz, 400 Hz, 450 Hz, 500 Hz, 600 Hz, 720 Hz, 750 Hz, 800 Hz, 900 Hz, 1.0 kHz, 1.2 kHz, 1.5 kHz, 1.8 kHz, 2.0 kHz, 2.4 kHz, 2.5 kHz, 3.0 kHz, 3.6 kHz, 4.0 kHz, 4.5 kHz, 5.0 kHz, 6.0 kHz, 7.2 kHz, 7.5 kHz, 8.0 kHz, 9.0 kHz, 10 kHz, 12 kHz, 15 kHz, 18 kHz, 20 kHz, 24 kHz, 25 kHz, 30 kHz, 36 kHz, 40 kHz, 45 kHz, 50 kHz, 60 kHz, 72 kHz, 75 kHz, 80 kHz, 90 kHz, 100 kHz, 120 kHz, 150 kHz, 180 kHz, 200 kHz
Frequency accuracy:	±100 ppm
AC test signal level:	50 mVrms…1.5 Vrms
Resolution:	10 mVrms
Drive level accuracy:	± (5 % + 5 mV)
Internal Bias Voltage:	0…+5.00 Vdc内置偏流源电压
Resolution:	10 mV
External Bias Voltage:	0…+ 40 Vdc (fused 0.5 A)
Internal Bias Current:	0…+200 mA
Resolution:	1 mA
Ranging:	Auto and Hold
Trigger:	Continuous, manual or external via interface, Binning Interface or Trigger Input
Trigger delay time:	0…999 ms in 1 ms steps
测试速度
FAST	70 ms
MEDIUM	125 ms
SLOW	0.7 s
其他功能参数
Test signal level monitor:	Voltage, current
Error Correction:	Open, Short, Load
Save / Recall:	9 instrument settings
Front-end Protection:	Vmax ‹ √2/C @ Vmax ‹ 200 V, C in Farads (1 Joule of stored energy)
Low Potential and Low Current Guarding:	Ground, Driven Guard or Auto (fused)
Constant Voltage Mode (25 Ω source)
Temperature effects: R, L or C:	± 5ppm/°C
Interface:	USB/RS-232 (HO820), IEEE-488 (option)
Safety Class:	Safety Class I (EN61010-1)
Power supply:	110…230 V ± 10 %, 50/60 Hz, CAT II
Power consumption:	approx. 20 Watt
Operating temperature:	+5°C...+40°C
Storage temperature:	-20°C...+70°C
Rel. humidity:	5%...80% (non condensing)
(W x H x D):	285 x 75 x 365 mm
Weight:	approx. 4 kg