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波长范围: 250到1000纳米
波长分辨率: 1nm
光斑大小:100μm ( 4倍) , 40μm ( 10倍) ,
30μm ( 15x ) , 8μm ( 50x )
基板尺寸:高达20毫米厚
可测量厚度范围: 2nm至25微米
测量时间:最低2毫秒
精度:优于0.5 %
重复性 : <2 Ǻ
System Configuration:
· Model: MSP100RTM
· Detector: CCD Array with 2048 pixels
· Light Source: High power DUV-Visible
· Automatic Stage: Black Anodized Aluminum Alloy with 5”x3” net travel distance and 1µm resolution, program controlled
· Motorized Z focus drive and X-Y-Z joystick
· Long Working Distance Objectives: 4x, 10x, 15x(DUV), 50x
· Communication: USB
· Measurement Type: Reflection/Transmission spectra, Film thickness/refractive index and feature dimensions
· Computer: Intel Core 2 Duo Processor with 200GB Hard drive and DVD+RW Burner plus 19” LCD Monitor
· Power: 110– 240 VAC /50-60Hz, 3 A
· Dimension: 16’x16’x18’ (Table top setup)
· Weight: 120 lbs total
· Warranty: One year labor and parts
- 询价产品:MSP100 分光光度计即薄膜测厚分析系统 MSP100
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