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X射线探测器
姓名:王工(Karl)
电话:186 1603 9606
邮箱:kangjun-wang@auniontech.com
X射线探测器以热电冷却的Si-Pin光电二极管作为X射线探测元器件,根据不同探测器类型和峰化时间,55Fe的5.9KeV峰值分辨率可达145eV; FAST SDD 探测器峰值分辨率更可达122eV,为业界优越指标。
XR-100系列 探测器型号 |
探测器材料 |
探测器面积 |
探测器厚度 |
铍(Be)窗 厚度 |
备注 |
XY-FSG32MD-G3SP |
Si-PIN |
6 mm2 |
500 μm |
1 mil |
有内置准直器 |
XY-FS432MD-G3SP |
Si-PIN |
13mm2 |
500 μm |
1 mil |
有内置准直器 |
XY-FSJ32MD-G3SP |
Si-PIN |
25mm2 |
500 μm |
1 mil |
有内置准直器 |
XY-FSG32MD-G2SP |
Si-PIN |
6mm2 |
500 μm |
0.5mil |
有内置准直器 |
XY-GSH3AMD-G2SP |
SDD |
25mm2 |
500 μm |
0.5mil |
有内置准直器 |
XY-GSH3AMD-E1SP |
SDD |
25mm2 |
500 μm |
0.3mil |
有内置准直器 |
XY-GSH3AMD-UOEA |
SDD |
25mm2 |
500 μm |
C1 Window |
有内置准直器 |
XY-GSH3AMD-E6EA |
SDD |
25mm2 |
500 μm |
C2 Window |
有内置准直器 |
XY-HSH3AMD-G2S |
FAST SDD |
25mm2 |
500 μm |
0.5mil |
有内置准直器 |
XY-HSH3AMD-G1S |
FAST SDD |
25mm2 |
500 μm |
0.3mil |
有内置准直器 |
XY-HSH3AMD-U0EA |
FAST SDD |
25mm2 |
500 μm |
C1 Window |
有内置准直器 |
XY-HSH3AMD-E6EA |
FAST SDD |
25mm2 |
500 μm |
C2 Window |
有内置准直器 |
** Silicon Drift Detector (SDD) uses a junction gate field-effect transistor (JFET) inside the hermetically sealed TO-8 package, along with an external preamplifier. FAST SDD uses a complementary metal-oxide-semiconductor (CMOS) preamplifier inside the TO-8 package, and replaces the JFET with a metal-oxide-semiconductor field-effect transistor (MOSFET).